Leica EM TXP

The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples which prior to examination by SEM, TEM, and LM techniques. An integrated stereomicroscope allows pinpointing and easy preparation of barely visible targets. With the Leica EM TXP, the small size samples can easily be prepared. Furthermore, due to its versatility, the EM TXP is a very efficient tool for sample pre-preparation which prior to ion beam milling and ultramicrotomy. With the specimen pivot arm, the sample can be observed directly at an angle between 0° and 60°, or 90° to the front face for distance determination with an eyepiece graticule.

Applications

The Leica EM TXP is a unique target surfacing system developed for cutting and polishing samples.

Strengths

• Reduced process time

• In-situ observation with a stereomicroscope

• Accurate location and preparation of microtargets

• Continuous observation with a stereo microscope

• Complete mechanical preparation system prior to Ion Milling

• Multifunctional machine processing - cutting, sawing, grinding, polishing

Features

• The automation function of Leica EM TXP gives the user additional support for quick and reliable preparation.

• The integrated stereomicroscope that enables the user to observe the specimen during the entire machining process.

• Automatic process control to produce a mirror-like surface quality.

• Brightness control and segment selection of LED-ring illumination.