Through our global network of testing experts and analytical equipment including chromatography (HPLC, GC, GC/MS) and atomic
absorption spectroscopy (AAS, GFA, FIAS), Our goal is to provide test services as efficiently
as possible to maximize our customers' profits. For more information about our services,
contact one of our experts today.
Note: this service is for Research Use Only and Not intended for clinical use.
The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples which prior to examination by SEM, TEM, and LM techniques. An integrated stereomicroscope allows pinpointing and easy preparation of barely visible targets. With the Leica EM TXP, the small size samples can easily be prepared. Furthermore, due to its versatility, the EM TXP is a very efficient tool for sample pre-preparation which prior to ion beam milling and ultramicrotomy. With the specimen pivot arm, the sample can be observed directly at an angle between 0° and 60°, or 90° to the front face for distance determination with an eyepiece graticule.
Applications
The Leica EM TXP is a unique target surfacing system developed for cutting and polishing samples.
Strengths
Reduced process time
In-situ observation with a stereomicroscope
Accurate location and preparation of microtargets
Continuous observation with a stereo microscope
Complete mechanical preparation system prior to Ion Milling