X-ray Diffractometer

AXIS Ultra DLD multifunctional X-ray photoelectron spectroscopy can provide chemical information about solid surface and interface. It is possible to analyze all elements except hydrogen and helium, including their types and valence states. It can also provide a semi-quantitative analysis of the relative content of elements. The instrument is widely used in the study of polymers, inorganic compounds, organic compounds, catalysts, coating materials, nano-materials, ores and other materials.

X-ray fluorescence spectrometer has the advantages of non-destructive, fast, high accuracy, qualitative and quantitative accuracy. It is a powerful complement to atomic absorption, ICP and other instruments. X-ray fluorescence Spectrometer (XRF) is widely used in rapid analysis of chemical elements in materials such as iron and steel, nonferrous, petrochemical, geological, glass, electronic and nano-materials.

2nd D8 VENTURE/QUEST is a powerful X-ray single crystal diffractometer developed by Bruker Company. Integrated design, equipped with the world's advanced light source and PHOTON II CPAD detector, can help you test the most challenging crystal, and have access to high-quality data.

The Bruker D8 ADVANCE Powder X-ray Diffractometer can be used to analyze the structural parameters of the powder samples, such as the qualitative and quantitative analysis of the phase, the indexing of the diffraction pattern and the determination of the lattice parameters, the determination of the grain size and lattice distortion, and the fitting of the powder diffraction pattern to modify the crystal junction, structure analysis, crystallinity measurement, and dynamic analysis of structure change at high and low temperature.

An EDX fluorescence spectrometer irradiates a sample with X-rays, and then measures the energy of the generated fluorescent X-rays to determine the type and amount of elements comprising the sample. This nondestructive analysis technique allows measurement of a wide variety of sample types (solids, powders, liquids, thin films, etc).

The Bruker S1 TITAN 600 Handheld XRF Spectrometer is equipped with a large area CUBE™ SDD detector, calibrates 37 Elements, including Mg, Al & Si, and can take sample temperatures up to 150°C with the Ultralene® window and up to 500°C with the Kapton® window. An integrated camera is optional. Wielding superior large-area detector technology, S1 TITAN models are capable of calibrating alloy, gold and precious metals, bulk material (E‐scrap and catalytic converters), soil, mining, restricted materials, and customer specific applications.

Small Angle X-ray Scattering (SAXS) is a technique particularly suited for the structural investigation of partially ordered materials, usually applied to condensed matter systems. SAXS provides information about larger scale bulk microstructure within a sample, usually in the size range from approximately ~1nm up to around 300nm.