Through our global network of testing experts and analytical equipment including chromatography (HPLC, GC, GC/MS) and atomic
absorption spectroscopy (AAS, GFA, FIAS), Our goal is to provide test services as efficiently
as possible to maximize our customers' profits. For more information about our services,
contact one of our experts today.
Note: this service is for Research Use Only and Not intended for clinical use.
The intrinsic properties of materials depend largely on the electronic structure, atomic structure and chemical bond structure of the material. Therefore, structural characterization of materials is important for assessing the properties of materials. As an analytical testing company with extensive experience in structural characterization of various materials, Alfa Chemistry materials and structural analysis services provide you with outstanding capabilities in materials science research and development.
Our instrument platform for material structural characterization includes X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscope (TEM), raman spectroscopy, X-ray photoelectron spectroscopy (XPS), ultraviolet–visible (UV–vis) spectroscopy, nuclear magnetic resonance (NMR) spectroscopy, X-ray absorption spectroscopy (XAS), electron energy loss spectroscopy (EELS), energy-dispersive X-ray spectroscopy (EDS), fourier transform infrared analysis (FTIR) and atomic force microscopy (AFM).
The material structural characterization services we provide include:
In addition to traditional chemical analysis techniques, chemical composition analysis of materials includes mass spectrometry, ultraviolet spectroscopy, visible spectroscopy, infrared spectroscopy, gas chromatography, liquid chromatography, nuclear magnetic resonance, electron spin resonance, X-ray fluorescence spectroscopy, auger and X-ray photoelectron spectroscopy, secondary ion mass spectrometry, electron probes, atom probes, laser probes, etc.
The determination of the material structure is dominated by diffraction methods, which mainly include X-ray diffraction, electron diffraction, neutron diffraction, Musberg spectrum, γ-ray diffraction, and the like. The most widely used is X-ray diffraction, and this technology includes Debye powder photographic analysis, high temperature, normal temperature, low temperature diffractometer, back reflection and transmission Laue photography, and a quadruple diffractometer for measuring single crystal structure.
Morphology observation relies mainly on microscopy, which is a common method of viewing materials on a micron scale. Scanning electron microscopy and transmission electron microscopy push the scale of observation to sub-micron and micron levels. Scanning electron microscopy is useful for the analysis of fracture morphology of materials.
Alfa Chemistry provides structural characterization service for: