JSM-7800F Prime Field Emission Scanning Electron Microscope (FE-SEM)
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Note: this service is for Research Use Only and Not intended for clinical use.
Just like SEM, Field Emission Scanning Electron Microscope (FE-SEM) is an instrument that provides a wide variety of information on the sample surface, but with higher resolution and a much greater energy range. It works just like a conventional SEM: the sample surface is scanned with an electron beam while a monitor displays the information that interests us on the basis of the detectors available. The biggest difference between FESEM and SEM lies in the electron generation system. The FESEM uses a field emission gun that provides extremely focused high and low-energy electron beams, which greatly improves spatial resolution and helps to minimize the charging effect on non-conductive specimens and to avoid damage to electron beam sensitive samples. With the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH), JSM-7800FPRIME delivers the world's best resolution. In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
Specifications
| Specifications - JEOL JSM-7800F Prime | |
|---|---|
| Resolution | 0.7 nm (15 kV), 0.7 nm (1 kV), 3.0 nm (5 kV、WD10 mm、5 nA) |
| Image types | Secondary electron image, Backscattered-electron image |
| Accelerating voltage | 0.01 kV to 30 kV |
| Sample bias voltage | 0 to 5 kV |
| Probe current | pA to 500 nA, 500 nA@30 kV, 20 nA@2 kV |
| Magnification | ×25 to ×1,000,000 |
| OL aperture | 4-stage, X, Y adjustment function |
| Automatic function | Focus, Astigmatism correction, brightness, contrast |
| X | 70 nm |
| Y | 50 nm |
| WD (Z) | 2 mm to 41 mm |
| Tilt | -5 to +70° |
| Rotation | 360° |
| Motor drive | 5 axes |
| Specimen holders | 12.5 mm dia. ×10 mm H、32 mm dia ×20 mm H |
| GBSH Specimen holders | Maximum specimen size 26 mm dia × 10 mm H |
Features
In-Lens Schottky Plus Field Emission Electron Gun.
Surface observation using GBSH (Gentle Beam Super High Resolution).
Top surface imaging using Gentle Beam.
Super hybrid objective: SHL.
A new type of detector is used to filter electron energy.
Applications
The instrument is mainly used to observe the most subtle nanostructures of various materials and can image and analyze high magnetic samples at low voltages. These materials and samples include:
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Submit quotation request |
A technical manager will contact you within 24 hours |
You will review and approve the final price and place an order |
Confirm with you and make the payment |
Instruct you to ship your samples and form |
Analytic report delivery |
