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Note: this service is for Research Use Only and Not intended for clinical use.
TALOS F200X is a new field emission transmission electron microscope with real multi-functions and multi-user environments. It flexibly integrates various transmission electron microscopy techniques (including TEM, SDD, STEM, etc.) to obtain stronger analysis functions. Adopting Schotty field emission electron gun which has high emission current, the machine can capture images with high brightness and good stability. It can be applied in the observation and analysis of material microstructure, morphology image analysis, electron diffraction image analysis, HRTEM high resolution image analysis and STEM analysis.
Observing material's patterns and organizational structures
Taking visual pictures
Providing relevant information such as crystal structures,micro-area chemical compositions of sample and element distribution (line scanning, surface scanning) of selected areas
High resolution, high magnification, and high picture pixel
TALOS F200X | |
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Acceleration voltage | 200KV |
Point resolution | 0.25nm |
TEM information resolution | 0.12nm |
STEM resolution | 0.16nm |
Tilt angle X/Y of the sample | ±30° |
Energy resolution of spectrum | 136ev |
Element detection range | B~U elements |
Key features and specifications of the microscope:
Maximum accelerating voltage of 200 kV
Constant power A-TWIN objective lens
X-FEG field emission source; brightness 1.8×109 A/cm2 srad (at 200 kV)
Total beam current >50 nA
Probe current, 0.4 nA in 0.31 nm probe (at 200 kV), 1.5 nA at 1.0 nm probe (at 200 kV)
Super X-EDS system (energy dispersive spectroscopy); 4 Silicon drift detectors (SDD) symmetric design, windowless, shutter protected
Energy resolution £ 136 eV for Mn-Ka and 10 kcps (kilo counts per second output)
Fast EDS mapping; pixel dwell time down to 10 ms (up to 105 spectra/sec)
VeloxTM S/TEM for improved imaging with a drift corrected frame integration (DFCI) engine
STEM high angle annular dark field (HAADF) resolution (nm) 0.16
EDX solid angle (srad) 0.9
TEM information limit (nm) 0.12
TEM point resolution (nm) 0.25
TEM spherical aberration 1.3mm, STEM spherical aberration 1.0 mm
STEM magnification range 150× - 230 M×
TEM magnification range 25× - 1.5 M×
Camera length (mm) 12-5100
Maximum diffraction angle ±12°
Maximum tilt angle with double tilt holder ±30°
Maximum goniometer (stage) tilt angle ±90°
SmartCam digital search and view camera
Fully integrated fast detector, Ceta 16 Mpixel CMOS camera with a large field of view and high-read out speed (2 frames per second (fps) at 4K and 18 fps at 1K)
Piezo stage
Full remote operation with automatic aperture system in combination with the Ceta camera
Do not know how to place an order, please refer to the flow chart shown below.
Submit quotation request |
A technical manager will contact you within 24 hours |
You will review and approve the final price and place an order |
Confirm with you and make the payment |
Instruct you to ship your samples and form |
Analytic report delivery |