Through our global network of testing experts and analytical equipment including chromatography (HPLC, GC, GC/MS) and atomic
absorption spectroscopy (AAS, GFA, FIAS), Our goal is to provide test services as efficiently
as possible to maximize our customers' profits. For more information about our services,
contact one of our experts today.
Note: this service is for Research Use Only and Not intended for clinical use.
TALOS F200X is a new field emission transmission electron microscope with real multi-functions and multi-user environments. It flexibly integrates various transmission electron microscopy techniques (including TEM, SDD, STEM, etc.) to obtain stronger analysis functions. Adopting Schotty field emission electron gun which has high emission current, the machine can capture images with high brightness and good stability. It can be applied in the observation and analysis of material microstructure, morphology image analysis, electron diffraction image analysis, HRTEM high resolution image analysis and STEM analysis.
Applications
Observing material's patterns and organizational structures
Taking visual pictures
Providing relevant information such as crystal structures,micro-area chemical compositions of sample and element distribution (line scanning, surface scanning) of selected areas
Strengths
High resolution, high magnification, and high picture pixel
Specifications
TALOS F200X
Acceleration voltage
200KV
Point resolution
0.25nm
TEM information resolution
0.12nm
STEM resolution
0.16nm
Tilt angle X/Y of the sample
±30°
Energy resolution of spectrum
136ev
Element detection range
B~U elements
Key features and specifications of the microscope:
Probe current, 0.4 nA in 0.31 nm probe (at 200 kV), 1.5 nA at 1.0 nm probe (at 200 kV)
Super X-EDS system (energy dispersive spectroscopy); 4 Silicon drift detectors (SDD) symmetric design, windowless, shutter protected
Energy resolution £ 136 eV for Mn-Ka and 10 kcps (kilo counts per second output)
Fast EDS mapping; pixel dwell time down to 10 ms (up to 105 spectra/sec)
VeloxTM S/TEM for improved imaging with a drift corrected frame integration (DFCI) engine
STEM high angle annular dark field (HAADF) resolution (nm) 0.16
EDX solid angle (srad) 0.9
TEM information limit (nm) 0.12
TEM point resolution (nm) 0.25
TEM spherical aberration 1.3mm, STEM spherical aberration 1.0 mm
STEM magnification range 150× - 230 M×
TEM magnification range 25× - 1.5 M×
Camera length (mm) 12-5100
Maximum diffraction angle ±12°
Maximum tilt angle with double tilt holder ±30°
Maximum goniometer (stage) tilt angle ±90°
SmartCam digital search and view camera
Fully integrated fast detector, Ceta 16 Mpixel CMOS camera with a large field of view and high-read out speed (2 frames per second (fps) at 4K and 18 fps at 1K)
Piezo stage
Full remote operation with automatic aperture system in combination with the Ceta camera