Nanonavi E-Sweep

Nanonavi E-Sweep is a true environmentally controllable atomic force microscope that can be used to select different environments such as high-vacuum environments, air environments, liquid environments, humidity environments, special gas environments, and temperature-changing environments through simple operations. In high vacuum environment, not only can the formation of water film on the surface of the sample be prevented, the accuracy of sample scanning resolution and surface physical property test measurement can be improved. The scanning sensitivity of AFM can also be improved by Q value control, thereby improving the resolution of the image. The vacuum environment can avoid oxidation of certain samples and provides an excellent environment for low temperature scanning to avoid the effects of crystallization of water molecules in the air.

Performance:

• Scanning range: 180 μm × 180 μm × 5 μm

• Measureable sample size: diameter 30mm, thickness 10mm

• Vertical resolution: 0.02nm

• Horizontal resolution: less than 1nm

Sample Requirements:

• Sample size: maximum 2.5 × 2.5cm, the maximum thickness 1cm; if tested under variable temperature, sample size 1 × 1cm, thickness less than 2mm

• The upper and lower surfaces of the sample are clean and tidy, and there are no pollutants such as oil dust

• The maximum scanning range of the instrument is 180×180×5μm

• If it is a nanoparticle sample, you must disperse it with a certain dispersing agent, take a drop on a very flat substrate such as mica, and test it after drying. If there is no mica film, please go to the lab before testing

• If there is inorganic salt on the surface of the sample, removing the salt with water and test it later, because the salt crystallize affects the scanning of the morphology

• If the film thickness is to be tested, a clear boundary must be made between the film and the substrate in advance. The test items:
  1. Basic morphology
  2. Force curve, adhesion
  3. Phase diagram, magnetic domain, STM, nano-etching, nano-manipulation, friction performance
  4. Conductivity

Features:

The environment-controlled scanning probe microscope can realize the in-situ measurement of the nanostructure of the sample surface under variable temperature and vacuum conditions, which provides an important condition for studying the structural changes under different temperature atmospheres.

• Continuous temperature change design: continuously change temperature from -120 °C to 300 °C, no need to replace the heating table, achieve large-scale in-situ temperature measurement

• Drift elimination mechanism: greatly eliminates drift of scanning, drift speed 0.015nm/sec

• Vacuum system: high vacuum can be achieved in a short time up to ~10⁷Torr

• Q value control function greatly increases the sensitivity of phase diagram, magnetic domain and other tests

Applications

• Characterization of surface topography, size, thickness and roughness of solid materials

• Particle size and morphology

• Study the distribution of materials with different resistivity

• Microscopic friction properties, magnetic properties and phase diagram characterization of solid materials

• Nano-etching according to self-designed graphics

• STM Characterization of Conductor Semiconductor Microtopography and I-V Curve

Figure 1. The *Nanonavi E-Sweep