Thermo Fisher Scientific Helios 5 CX DualBeam FIB

Inquiry

Through our global network of testing experts and analytical equipment including chromatography (HPLC, GC, GC/MS) and atomic absorption spectroscopy (AAS, GFA, FIAS), Our goal is to provide test services as efficiently as possible to maximize our customers' profits. For more information about our services, contact one of our experts today.

Note: this service is for Research Use Only and Not intended for clinical use.

The Thermo Fisher Scientific Helios 5 CX DualBeam is an advanced dual-beam platform designed for high-resolution imaging, precision ion beam processing, and site-specific sample preparation. By integrating the high-performance Elstar electron column with the Tomahawk HT Focused Ion Beam column, the system combines advanced electron imaging and precise ion beam milling within a single instrument. It enables efficient preparation of high-quality TEM and Atom Probe Tomography (APT) specimens while supporting accurate cross-sectioning, subsurface characterization, and nanoscale fabrication. Therefore, the system supports advanced research and development in materials science, nanotechnology, semiconductor failure analysis, and engineering applications by enabling detailed investigation of structures and defects at the nanoscale.

Request a Test See More Details

Key FeaturesTechnical SpecificationsApplications

High-throughput Tomahawk HT FIB Column for rapid, site-specific preparation of high-quality TEM and APT specimens.
Optional AutoTEM 5 software enabling automated, unattended preparation of multiple in-situ and ex-situ TEM lamellae, as well as automated cross-sectioning.
Optional Auto Slice & View 4 (AS&V4) for high-quality three-dimensional and multimodal subsurface characterization with precise targeting of regions of interest.
Integrated detector architecture, offering up to six detectors positioned within the column and below the objective lens to provide comprehensive image contrast with reduced charging effects.
High-precision FIB milling and deposition capable of machining complex structures with critical dimensions below 10 nm.
Flexible sample handling system, featuring a 110 mm stage, versatile specimen holders, and Nav-Cam+ for efficient sample navigation.
Artifact-reduction technologies, including integrated contamination management and dedicated imaging modes such as DCFI and SmartScan for cleaner, higher-quality images.

Parameter	Specification
Electron Beam Resolution	0.6 nm at 15 kV; 0.9 nm at 1 kV
Electron Beam Accelerating Voltage	200 V – 30 kV
Electron Beam Current	0.8 pA – 176 nA
Ion Beam Resolution	2.5 nm at 30 kV (edge method)
Ion Beam Accelerating Voltage	500 V – 30 kV
Ion Beam Current	1 pA – 100 nA

The Helios 5 CX DualBeam is an indispensable asset for advanced R&D, failure analysis, and quality control across nanotechnology, materials science, and engineering fields. Its core applications include:

Ultra-Thin TEM & APT Lamella Preparation: Fast, site-specific extraction of pristine specimens for high-resolution transmission electron microscopy and atom probe tomography.
Nanoscale Prototyping: Accurate surface micro-machining and gas-assisted deposition of complex structures below 10 nm.
Subsurface Characterization: Serial sectioning and high-resolution imaging to unveil volumetric structures, defects, and material interfaces without artifacts, supported by dedicated DCFI and SmartScan imaging modes.

The addition of the Thermo Fisher Scientific Helios 5 CX DualBeam FIB significantly expands laboratory's advanced microscopy and sample preparation capabilities. By integrating high-resolution electron imaging, precise focused ion beam processing, automated specimen preparation, and sophisticated subsurface characterization within a single platform, the system enables efficient, reproducible workflows for complex analytical tasks.

Leverage This Instrument for Advanced Testing

Recommendation
Ordering Process
Ask a Question

ZEISS Xradia 620 Versa X-Ray Microscope

Do not know how to place an order, please refer to the flow chart shown below.

Submit quotation request

A technical manager will contact you within 24 hours

You will review and approve the final price and place an order

Confirm with you and make the payment

Instruct you to ship your samples and form

Analytic report delivery

If you have questions at any time during the process, just give us a call or send us an email at . We will do all we can to meet your needs.

Online Inquiry

Please fill out the form below and our experts will give you feedback within 36 hours.
If it is urgent, you can contact us directly through the contact information below.
Email:
Contact Information
Company / Organization:
Contact Name:
Title:
Address1:
Address2:
City:
State/Province:
Zip/Postal Code:
Country:
Phone:
Fax:
* Email:
Testing Information
* Type of Test:
* Number of Samples:
* Sample State:
Sample Source:
Test Items:
Other Description:
How Did You Hear About Us:
* Verification Code

KEEP UP TO DATE

Subscribe to our newsletter and follow us on social media

Alfa Chemistry Testing Lab WeChat QR code