The Rigaku SmartLab Powder Diffractometer is a fully automated, multipurpose X-ray diffraction (XRD) platform designed for comprehensive materials characterization. Supporting applications ranging from routine powder diffraction to thin film metrology, small-angle X-ray scattering (SAXS), in-plane diffraction, and operando measurements, the system combines the high-flux PhotonMax 9 kW rotating anode X-ray source with the HyPix-3000 high-energy-resolution detector to deliver outstanding sensitivity, measurement speed, and analytical flexibility. Moreover, powered by SmartLab Studio II with intelligent Guidance functionality, the instrument simplifies complex XRD workflows by assisting users with instrument configuration and measurement setup, making advanced diffraction analysis more efficient and accessible.
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- Rigaku SmartLab Powder Diffractometer
Rigaku SmartLab Powder Diffractometer
InquiryThrough our global network of testing experts and analytical equipment including chromatography (HPLC, GC, GC/MS) and atomic absorption spectroscopy (AAS, GFA, FIAS), Our goal is to provide test services as efficiently as possible to maximize our customers' profits. For more information about our services, contact one of our experts today.
Note: this service is for Research Use Only and Not intended for clinical use.
- High-Flux X-ray Source and Multidimensional Detection
The SmartLab integrates the PhotonMax high-flux 9 kW rotating anode X-ray source with the HyPix-3000 semiconductor detector, providing excellent X-ray intensity and high energy resolution for demanding diffraction experiments. The detector supports 0D, 1D, and 2D measurement modes within a single platform, eliminating the need to exchange detectors for different applications.
- Automated Optics and Flexible System Configuration
The system incorporates Rigaku's Cross-Beam Optics (CBO) technology, including the fully automated CBO-Auto configuration, which enables seamless switching between reflection and transmission measurement geometries. The optional CBO-μ optics provides high-resolution micro-area analysis for localized structural characterization.
- Advanced Measurement Workflow
The system combines a high-precision θ/θ closed-loop goniometer for accurate sample positioning with an optional five-axis in-plane arm, expanding capabilities for thin-film and textured material analysis. Powered by SmartLab Studio II, it delivers a seamless end-to-end workflow from measurement to reporting. Its intelligent Guidance feature assists with optimal configuration selection and automates optical component alignment, effortlessly simplifying complex XRD experiments.
The Rigaku SmartLab accommodates a broad range of sample types, including powders, thin films, bulk materials, liquids, textiles, and other functional materials. It is widely used for phase identification, crystal structure analysis, crystallinity evaluation, residual stress measurement, texture characterization, X-ray reflectivity, thin film metrology, small-angle X-ray scattering (SAXS), in-plane diffraction, mapping measurements, and operando studies. These capabilities make the system an ideal solution for research and quality control in materials science, semiconductors, energy storage, nanotechnology, chemicals, pharmaceuticals, advanced manufacturing, and academic research.
Rigaku SmartLab Powder Diffractometer significantly strengthens laboratory's X-ray diffraction capabilities by providing a highly automated and versatile platform for advanced structural characterization. By integrating multiple XRD techniques into a single instrument, the SmartLab enables efficient analysis of diverse materials while reducing the need for multiple dedicated systems. Its high-flux X-ray source, multidimensional detector, automated optical configuration, and intelligent software ensure accurate, reproducible, and high-quality diffraction data across a wide range of applications.
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