The PerkinElmer NexION 2000 is a high-performance inductively coupled plasma mass spectrometer (ICP-MS) designed for ultra-trace elemental analysis across a wide range of sample matrices. Combining innovative ion optics, advanced interference removal technologies, and exceptional sensitivity, the system enables accurate qualitative and quantitative determination of elemental concentrations at ppt levels. Engineered to handle complex matrices and demanding analytical challenges, it provides the flexibility to analyze virtually any element while maintaining excellent detection limits and data quality.
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- PerkinElmer NexION 2000 ICP-MS
PerkinElmer NexION 2000 ICP-MS
InquiryThrough our global network of testing experts and analytical equipment including chromatography (HPLC, GC, GC/MS) and atomic absorption spectroscopy (AAS, GFA, FIAS), Our goal is to provide test services as efficiently as possible to maximize our customers' profits. For more information about our services, contact one of our experts today.
Note: this service is for Research Use Only and Not intended for clinical use.
Key FeaturesTechnical SpecificationsApplications
- SMARTintro™ sample introduction module for simplified setup and enhanced workflow efficiency
- Extended Dynamic Range (EDR) technology for simultaneous measurement of high- and low-concentration elements in a single run
- Triple Cone Interface and Universal Cell Technology for superior interference management
- Three quadrupoles, three gas channels, and three operating modes for enhanced analytical flexibility
- Ultra-fast data acquisition speed up to 100,000 points per second
- Excellent sensitivity and low detection limits for trace and ultra-trace elemental analysis
- High matrix tolerance for challenging sample types
| Parameter | Specification |
| Mass Range | 1–280 amu |
| Data Acquisition Speed | Up to 100,000 points/sec |
| Resolution | Continuously adjustable from 0.2–2.0 amu |
| Sensitivity (Low Mass) | ≥ 50 Mcps/ppm |
| Sensitivity (Mid Mass) | ≥ 100 Mcps/ppm |
| Sensitivity (High Mass) | ≥ 80 Mcps/ppm |
| Detection Limit – Be (9) | < 0.5 ppt |
| Detection Limit – In (115) | < 0.1 ppt |
| Detection Limit – U (238) | < 0.1 ppt |
The NexION 2000 ICP-MS supports a broad range of elemental analysis applications, including but not limited to:
- Metal and alloy analysis
- Polymer and composite materials testing
- Semiconductor materials characterization
- Fine chemicals and specialty chemicals analysis
- Pharmaceutical and medical materials testing
- Food safety and nutritional analysis
- Soil and environmental monitoring
- Drinking water and wastewater analysis
The PerkinElmer NexION 2000 ICP-MS significantly enhances elemental analysis capabilities by providing ultra-trace detection, outstanding interference removal, and exceptional analytical flexibility. Its advanced ICP-MS architecture enables accurate quantification of trace and ultra-trace elements across diverse sample matrices, from high-purity semiconductor materials to complex environmental samples.
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Do not know how to place an order, please refer to the flow chart shown below.
Submit quotation request |
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Confirm with you and make the payment |
Instruct you to ship your samples and form |
Analytic report delivery |
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