JEOL JEM-F200 TEM

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The JEOL JEM-F200 TEM is a field-emission transmission electron microscope designed for high-resolution imaging and advanced microstructural characterization across a wide range of scientific and industrial applications. Equipped with a cold field-emission electron gun (CFEG), the system delivers exceptional beam brightness, stability, and energy resolution, enabling detailed investigation of materials from the nanoscale down to atomic dimensions.

The instrument supports both TEM and STEM observation modes and is optimized for high-quality imaging, elemental analysis, and structural characterization at various accelerating voltages. With its user-friendly operating platform, automated functions, and advanced analytical capabilities, the JEM-F200 provides an efficient solution for research, quality assessment, and materials development.

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Key FeaturesTechnical SpecificationsApplications
  • A cold field emission electron gun provides high brightness, excellent stability, and energy resolution below 0.33 eV for high-quality TEM and STEM imaging.
  • High-sensitivity EDS analysis is supported through large-area silicon drift detectors, enabling rapid elemental characterization with reduced sample damage.
  • Optional EELS capability allows detailed investigation of chemical bonding states and electronic structures at high energy resolution.
  • Automated operation, intuitive software, and FIB-compatible sample transfer streamline workflows from specimen preparation to nanoscale characterization.
ParameterSpecification
Point Resolution0.23 nm
TEM Line Resolution≤ 0.10 nm at 200 kV; ≤ 0.14 nm at 80 kV
STEM Resolution≤ 0.19 nm
Lattice Resolution0.10 nm
Magnification Range50× – 2,000,000×
Electron SourceCold Field Emission Electron Gun (CFEG)
Energy Resolution< 0.33 eV
EDS DetectorSilicon Drift Detector (SDD), Effective Area > 120 mm2
Camera System4k × 4k CCD Camera
Additional ConfigurationSTEM Probe

The JEOL JEM-F200 TEM enables comprehensive characterization of material structure, morphology, interfaces, and composition at the nanometer and atomic scales. By transmitting high-energy electrons through ultra-thin specimens, the instrument provides detailed information on crystal structures, grain boundaries, defects, phase distributions, and interfacial features.

Its analytical capabilities support quantitative and semi-quantitative elemental analysis, making it a valuable tool for investigations in materials science, nanotechnology, electronics, energy storage, metallurgy, chemistry, life sciences, and biomedical research. The system is also widely used for failure analysis, process optimization, quality control, and advanced research applications requiring nanoscale structural insight.

Combining high-resolution TEM/STEM imaging with elemental and spectroscopic analysis, the platform enables comprehensive evaluation of complex materials and microstructures within a single analytical workflow.

This capability provides deeper insight into material composition, crystallography, interface behavior, defect mechanisms, and nanoscale structural evolution. As a result, it can deliver more accurate and reliable analytical solutions to support research and development, manufacturing optimization, product qualification, and root-cause investigations across diverse industries.

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