Asylum Research Cypher ES AFM

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The Asylum Research Cypher ES is a high-performance atomic force microscope (AFM) engineered to deliver exceptional imaging accuracy while providing advanced environmental control for demanding nanoscale characterization. Designed for researchers who require precise measurements under a variety of experimental conditions, the Cypher ES combines ultra-low noise, high-speed imaging, and versatile measurement capabilities within a fully sealed sample chamber. It supports studies in controlled gas or liquid environments, as well as temperature- and humidity-controlled experiments, making it an ideal platform for investigating complex materials and biological samples. With its broad range of imaging and functional measurement modes, the Cypher ES enables reliable nanoscale analysis across multiple scientific and industrial applications.

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Key FeaturesTechnical SpecificationsApplications

Fully sealed, chemically resistant sample chamber for controlled gas, liquid, humidity, and temperature environments.
Ultra-low noise performance with a noise floor of only 15 pm for highly sensitive measurements.
High-speed imaging that significantly reduces acquisition time while maintaining excellent image quality.
Exclusive blueDrive® photothermal tapping technology for stable, reproducible, and high-resolution tapping mode imaging.
Comprehensive imaging modes for topographical (tapping mode, contact mode, phase imaging, blueDrive® photothermal tapping), mechanical (force spectroscopy, force modulation), electrical (KPFM, conductive AFM (CAFM), PFM, time-dependent dielectric breakdown (up to 200 V)), and functional property characterization.
Designed for demanding nanoscale research requiring both environmental flexibility and measurement precision.

Parameter	Specification
Maximum Scan Area	30 μm × 30 μm
Z Scan Range	5 μm
Maximum Sample Size	1.5 cm × 1.5 cm
Lateral Resolution	0.6 Å
Vertical Resolution	0.5 Å
Noise Floor	15 pm
Environmental Control	Fully sealed chamber supporting controlled gas, liquid, humidity, heating, and cooling experiments

The Asylum Research Cypher ES AFM supports advanced nanoscale characterization for a wide variety of research and industrial materials. Its environmental control capabilities enable reliable imaging and property measurements under realistic operating conditions, making it particularly valuable for studying moisture-sensitive, temperature-dependent, and liquid-phase samples. Typical applications include the structural characterization of 2D materials, investigation of piezoelectric and ferroelectric materials, surface and mechanical analysis of polymers and composite materials, nanoscale imaging of biomolecules and biological membranes, and evaluation of energy materials such as battery and photovoltaic components. The instrument is also well suited for electrical property mapping and force-based measurements required in advanced materials research.

The addition of the Asylum Research Cypher ES AFM significantly expands laboratory's nanoscale surface characterization capabilities. By combining ultra-high-resolution imaging with integrated environmental control, the system enables precise analysis under conditions that closely replicate real-world operating environments. Its ability to perform topographical, mechanical, and electrical measurements on a single platform allows experts to obtain comprehensive information about material behavior and functional performance.

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