AMI-150-U-5 Electrochemical Migration Evaluation System

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The AMI-150-U-5 Electrochemical Migration Evaluation System is a high-performance reliability testing platform designed to evaluate the insulation performance and electrochemical migration (ECM) behavior of electronic materials and components under controlled environmental conditions. By integrating an environmental chamber with a precision electrical measurement system, the instrument continuously monitors insulation resistance and leakage current throughout the test process, providing accurate and real-time assessment of insulation degradation and failure mechanisms.

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Key FeaturesTechnical SpecificationsApplications

The system supports insulation reliability evaluations over a broad DC voltage range.
Proprietary event detectors continuously monitor every measurement channel throughout the test. When insulation resistance falls below a predefined threshold, it will direct the measuring equipment to begin recording at a set interval.
A dedicated connection unit simplifies installation and removal of measurement cables, significantly improving operational efficiency during routine sample preparation and replacement.
It can simultaneously connect with up to four environmental test chambers via Ethernet. In addition to recording insulation resistance and applied voltage, the system continuously acquires chamber temperature and humidity data, automatically storing all environmental and electrical parameters within the measurement file for comprehensive test documentation and traceability.

Parameter	Specification
Total Measurement Channels	150 channels
Applied Stress Voltage	DC 0 V; 1.0–500 V
Current Measurement Range	0.1 fA–20 mA
DC Current Measurement Range	0.001 pA–0.5 mA
Resistance Measurement Range	1.0 × 10⁶–5.0 × 10¹³ Ω (500 V); 2.0 × 10³–1.0 × 10¹¹ Ω (1.0 V)
Environmental Chamber Range	–20 °C to 180 °C; 10% RH to 98% RH

The AMI-150-U-5 Electrochemical Migration Evaluation System is designed for evaluating insulation reliability under controlled temperature and humidity conditions by continuously measuring insulation resistance and leakage current. It provides valuable data for assessing material performance, degradation behavior, and long-term reliability in electronic assemblies. Typical applications include:

Electrochemical migration (ECM) testing of printed circuit boards and electronic assemblies
Insulation resistance and leakage current measurements under temperature and humidity stress
Reliability evaluation of fluxes, photoresists, resins, and electronic packaging materials
Reliability testing of OLED-related materials and electronic components
Assessment of ionic migration and insulation degradation in humid environments
Material qualification, reliability verification, and failure analysis for electronic products

The system is widely used in the electronics, semiconductor, electronic packaging, information materials, advanced composites, and precision manufacturing industries.

The addition of the AMI-150-U-5 Electrochemical Migration Evaluation System further strengthens laboratory's capabilities in electronic reliability assessment and insulation performance testing. By combining highly sensitive electrical measurements with precise environmental control, the system enables comprehensive evaluation of electrochemical migration behavior and insulation degradation under accelerated environmental conditions, delivering accurate, reproducible, and standards-based testing data for customers across the electronics, semiconductor, advanced materials, and manufacturing industries.

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